Spectral characteristics of plane multilayer amplitude diffraction gratings for the soft x-ray range

被引:0
|
作者
Troussel, P.
Bac, S.
Kolachevskij, N.N.
Mitropol'skij, M.M.
Ragozin, E.N.
机构
来源
Gornyi Zhurnal | / 23卷 / 9-10期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:923 / 927
相关论文
共 50 条
  • [21] Non-periodic multilayer coatings in EUV, soft X-ray and X-ray range
    Wang, Zhanshan
    ADVANCES IN OPTICAL THIN FILMS III, 2008, 7101
  • [22] X-ray Diffraction Gratings for Astrophysics
    Frits Paerels
    Space Science Reviews, 2010, 157 : 15 - 24
  • [23] X-ray Diffraction Gratings for Astrophysics
    Paerels, Frits
    SPACE SCIENCE REVIEWS, 2010, 157 (1-4) : 15 - 24
  • [24] Soft x-ray multilayer coated echelle gratings: electromagnetic and phenomenological study
    Neviere, M.
    Montiel, F.
    Journal of the Optical Society of America A: Optics and Image Science, and Vision, 1996, 13 (04):
  • [25] Evaluations of optical properties of Co based soft x-ray multilayer gratings
    Ishino, Masahiko
    Koike, Masato
    Satou, Futami
    Terauchi, Masami
    Sano, Kazuo
    Sasai, Hiroyuki
    JOURNAL OF APPLIED PHYSICS, 2008, 104 (07)
  • [26] Extended theory of soft x-ray reflection for realistic lamellar multilayer gratings
    van der Meer, R.
    Kozhevnikov, I. V.
    Bastiaens, H. M. J.
    Boller, K. -J.
    Bijkerk, F.
    OPTICS EXPRESS, 2013, 21 (11): : 13105 - 13117
  • [27] Soft x-ray multilayer coated echelle gratings: Electromagnetic and phenomenological study
    Lab. d'Optique Electromagnetique, U. Rech. Associee au Ctr. Natl. R., Fac. des Sci. de S.-Jerome, Boite 262, 13397 Marseille Cedex 20, France
    J Opt Soc Am A, 4 (811-818):
  • [28] Soft x-ray multilayer coated echelle gratings: Electromagnetic and phenomenological study
    Neviere, M
    Montiel, F
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1996, 13 (04): : 811 - 818
  • [29] MULTILAYER GRATINGS FOR THE SOFT-X-RAY REGION
    ANDRE, JM
    SAMMAR, A
    MALEK, CK
    TROUSSEL, P
    BAC, S
    BARCHEWITZ, R
    PARDO, B
    BERROUANE, H
    MORENO, T
    LADAN, FR
    RIVOIRA, R
    SCHIRMANN, D
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01): : 1399 - 1403
  • [30] Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics
    Huang, Qiushi
    Medvedev, Viacheslav
    van de Kruijs, Robbert
    Yakshin, Andrey
    Louis, Eric
    Bijkerk, Fred
    APPLIED PHYSICS REVIEWS, 2017, 4 (01):