NEW METHOD FOR MEASURING RESISTIVITY OF HIGH RESISTANCE COMPOUND.

被引：0

作者：

Qi, Zengfang ^{[1
]}

机构：

[1] Nankai Univ, Tianjin, China, Nankai Univ, Tianjin, China

来源：

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 1987年 / 8卷 / 04期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：445 / 448

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