Spectroscopic infrared scanning near-field optical microscopy (IR-SNOM)

被引:0
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作者
Vobornik, D. [1 ]
Margaritondo, G. [1 ]
Sanghera, J.S. [2 ]
Thielen, P. [2 ]
Aggarwal, I.D. [2 ]
Ivanov, B. [3 ]
Tolk, N.H. [3 ]
Manni, V. [4 ]
Grimaldi, S. [4 ]
Lisi, A. [4 ]
Rieti, S. [4 ]
Piston, D.W. [5 ]
Generosi, R. [6 ]
Luce, M. [6 ]
Perfetti, P. [6 ]
Cricenti, A. [6 ]
机构
[1] Institut de Physique de la Matière Complexe, Ecole Polytechnique Fédérale de Lausanne (EPFL), Station 3, CH-1015 Lausanne, Switzerland
[2] Optical Sciences Division, U.S. Naval Research Laboratory, 4555 Overlook Avenue SE, Washington, DC 20375, United States
[3] Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 31235, United States
[4] Institute of Neurobiology and Molecular Medicine, 00133 Rome, Italy
[5] Department of Molecular Physiology and Biophysics, Vanderbilt University, Nashville, TN 37232, United States
[6] Istituto di Stuttura della Materia, via Fosso del Cavaliere 100, 00133 Rome, Italy
来源
Journal of Alloys and Compounds | 2005年 / 401卷 / 1-2期
关键词
This work is supported by the Italian National Research Council; Ecole Polytechnique Fédérale de Lausanne; the Fonds National Suisse de la Recherche Scientifique; the National Institutes of Health and the United States Office of Naval Research;
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摘要
21
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页码:80 / 85
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