Trap states elucidated by a.c. conductance measurement in polycrystalline chemically vapour-deposited diamond films

被引：0

作者：

Sugino, Takashi ^{[1
]}

Muto, Yasuaki ^{[1
]}

Karasutani, Kiyoshi ^{[1
]}

Shirafuji, Junji ^{[1
]}

Kobashi, Koji ^{[1
]}

机构：

[1] Osaka Univ, Osaka, Japan

来源：

关键词：

Synthetic diamonds;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：803 / 807

共 46 条

[41] Surface resistance and field emission current measurements on chemically vapour deposited polycrystalline diamond measured by scanning probe methods
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Tomokage, H
JOURNAL OF PHYSICS-CONDENSED MATTER, 2004, 16 (02) : S171 - S179
[42] Material properties and interfacial composition of thin films of TiN and Ti(C, N) physically vapour-deposited on iron
Carbucicchio, M
Martini, C
Palombarini, G
Rateo, M
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1997, 76 (04): : 669 - 676
[43] INFLUENCE OF ANNEALING ON THE RESISTANCE OF POLYCRYSTALLINE CHEMICALLY VAPOR-DEPOSITED DIAMOND FILMS - A SURFACE CHEMICAL EFFECT
GONON, P
DENEUVILLE, A
GHEERAERT, E
FONTAINE, F
DIAMOND AND RELATED MATERIALS, 1994, 3 (4-6) : 654 - 657
[44] Structural and environmental dependence of superlow friction in ion vapour-deposited a-C : H : Si films for solid lubrication application
Chen, Xinchun
Kato, Takahisa
Kawaguchi, Masahiro
Nosaka, Masataka
Choi, Junho
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2013, 46 (25)
[45] THERMALLY AND PHOTOINDUCED CHANGES IN THE VALENCE STATES OF VAPOUR-DEPOSITED AS2S3 FILMS - A COMPARATIVE PHOTOEMISSION-STUDY OF AS2S3 AND AS4S4
TAKAHASHI, T
HARADA, Y
SOLID STATE COMMUNICATIONS, 1980, 35 (02) : 191 - 194
[46] Measurement of residual stress and elastic modulus of polycrystalline 3C-SiC films deposited by low-pressure chemical vapor deposition
Fu, XA
Dunning, JL
Zorman, CA
Mehregany, M
THIN SOLID FILMS, 2005, 492 (1-2) : 195 - 202

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