CHARACTERIZATION OF TEGFET's AND MESFET's USING THE ELECTROOPTIC SAMPLING TECHNIQUE.

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作者：
Meyer, K.E. [1 ]
Dykaar, D.R. [1 ]
Mourou, G.A. [1 ]
机构：
[1] Univ of Rochester, Rochester, NY,, USA, Univ of Rochester, Rochester, NY, USA
来源：
IEEE Transactions on Electron Devices | 1985年 / ED-32卷 / 11期
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