Time resolved spectroscopy of mid-band-gap emissions in Si-doped GaN

被引:0
|
作者
Seitz, R. [1 ]
Gaspar, C. [1 ]
Monteiro, T. [1 ]
Pereira, E. [1 ]
Leroux, M. [1 ]
Beaumont, B. [1 ]
Gibart, P. [1 ]
机构
[1] Universidade de Aveiro, Aveiro, Portugal
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:546 / 550
相关论文
共 50 条
  • [21] Growth and characterization of Si-doped cubic GaN
    Tanaka, H
    Nakadaira, A
    COMPOUND SEMICONDUCTORS 1998, 1999, (162): : 669 - 674
  • [22] Dislocation core structures in Si-doped GaN
    Rhode, S. L.
    Horton, M. K.
    Fu, W. Y.
    Sahonta, S. -L.
    Kappers, M. J.
    Pennycook, T. J.
    Humphreys, C. J.
    Dusane, R. O.
    Moram, M. A.
    APPLIED PHYSICS LETTERS, 2015, 107 (24)
  • [23] Structural and optical properties of Si-doped GaN
    Cremades, A
    Görgens, L
    Ambacher, O
    Stutzmann, M
    Scholz, F
    PHYSICAL REVIEW B, 2000, 61 (04): : 2812 - 2818
  • [24] Optical properties of Si-doped GaN films
    Yang, HC
    Lin, TY
    Huang, MY
    Chen, YF
    JOURNAL OF APPLIED PHYSICS, 1999, 86 (11) : 6124 - 6127
  • [26] Repeatability of Si concentration measurements in Si-doped GaN films
    Chi, PH
    Simons, DS
    Wickenden, AE
    Koleske, DD
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1997, 15 (05): : 2565 - 2568
  • [27] SI-DOPED AND GE-DOPED GAN FILMS GROWN WITH GAN BUFFER LAYERS
    NAKAMURA, S
    MUKAI, T
    SENOH, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (9A): : 2883 - 2888
  • [28] Origins of Electrical Compensation in Si-Doped HVPE GaN
    Prozheev, Igor
    Iwinska, Malgorzata
    Sochacki, Tomasz
    Bockowski, Michal
    Bes, Rene
    Tuomisto, Filip
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2023, 260 (08):
  • [29] Residual Strain and Electronic Characteristics of Si-doped GaN
    LI Chao1
    2. Chongqing Optoelectronics Research Institute
    Semiconductor Photonics and Technology, 2008, (02) : 80 - 84
  • [30] Energy relaxation of hot electrons in Si-doped GaN
    Zhang, J. -Z.
    JOURNAL OF APPLIED PHYSICS, 2014, 115 (20)