IMAGING WITH RUTHERFORD SCATTERED ELECTRONS IN THE SCANNING TRANSMISSION ELECTRON MICROSCOPE.

被引：0
|
作者：
Treacy, M.M.J.
机构：
来源：
Scanning Electron Microscopy | 1981年
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
ELECTRONS - Scattering - FILMS
引用
收藏
页码：185 / 197
相关论文
共 50 条
  • [31] SMOOTH SURFACE METALLOGRAPHY USING THE SCANNING ELECTRON MICROSCOPE.
    Hall, M.G.
    Hutchinson, W.B.
    Metallurgist and materials technologist, 1980, 12 (07): : 371 - 375
  • [32] STUDY OF BLOWHOLES IN CAST STEEL BY A SCANNING ELECTRON MICROSCOPE.
    Kita, Kiyoshi
    International cast metals journal, 1979, 4 (04): : 35 - 40
  • [33] LOCALIZATION OF ANTIGENS WITH BACK SCATTERED ELECTRON IMAGING MODE OF THE SCANNING ELECTRON-MICROSCOPE
    NAKANE, PK
    CELL STRUCTURE AND FUNCTION, 1983, 8 (04) : 400 - 400
  • [34] The electron microscope.
    Hartmann, M
    Laue, MV
    Rosenheim, A
    Volmer, M
    NATURWISSENSCHAFTEN, 1932, 20 : 49 - 49
  • [35] The electron microscope.
    Waterman, AT
    AMERICAN JOURNAL OF SCIENCE, 1941, 239 (05) : 386 - 388
  • [36] Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms
    Inada, H.
    Su, D.
    Egerton, R. F.
    Konno, M.
    Wu, L.
    Ciston, J.
    Wall, J.
    Zhu, Y.
    ULTRAMICROSCOPY, 2011, 111 (07) : 865 - 876
  • [37] Specimen Stage for Fatigue Tests in the Scanning Electron Microscope.
    Kromp, Wolfgang
    Weiss, Brigitte
    Stickler, Roland
    1600, (10):
  • [38] Angioarchitecture of myocardial microvessels in the rat heart: Studied with scanning and transmission electron microscopes and confocal laser scanning microscope.
    Fujimoto, K
    Goto, M
    Matsumoto, T
    Toyota, E
    Tokuda, C
    Tsujioka, K
    Kajiya, F
    CIRCULATION, 1998, 98 (17) : 139 - 140
  • [39] SCANNING ION IMAGING AS A DIAGNOSTIC TOOL FOR AN ION MICROSCOPE.
    Brown, J.D.
    Vandervorst, W.
    1600, (07):
  • [40] Transmission electron imaging in the Delft multibeam scanning electron microscope 1
    Ren, Yan
    Kruit, Pieter
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2016, 34 (06):
12345