Simultaneous microphotoluminescence and micro-Raman scattering in porous silicon

被引：0
|
作者：
Universite Lyon, Villeurbanne, France [1 ]
机构：
来源：
Thin Solid Films | / 1-2卷 / 188-190期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] An experimental analysis of residual stress measurements in porous silicon using micro-raman spectroscopy
    Lei, ZK
    Kang, YL
    Hu, M
    Qiu, Y
    Xu, H
    Niu, HP
    CHINESE PHYSICS LETTERS, 2004, 21 (02) : 403 - 405
  • [22] Depth-resolved micro-Raman study of porous silicon at different oxidation states
    Moreno, JD
    AgulloRueda, F
    Montoya, E
    Marcos, ML
    GonzalezVelasco, J
    GuerreroLemus, R
    MartinezDuart, JM
    APPLIED PHYSICS LETTERS, 1997, 71 (15) : 2166 - 2168
  • [23] Inhomogeneous laser heating and phonon confinement in silicon nanowires:: A micro-Raman scattering study
    Adu, KW
    Gutiérrez, HR
    Kim, UJ
    Eklund, PC
    PHYSICAL REVIEW B, 2006, 73 (15)
  • [24] Ice mixtures formed by simultaneous condensation of formaldehyde and water:: an in situ study by micro-Raman scattering
    Chazallon, Bertrand
    Oancea, Adriana
    Capoen, Bruno
    Focsa, Cristian
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2008, 10 (05) : 702 - 712
  • [25] Micro-Raman scattering in laterally epitaxial overgrown GaN
    Tripathy, S
    Chua, SJ
    Hao, MS
    Sia, EK
    Ramam, A
    Zhang, J
    Sun, WH
    Wang, LS
    JOURNAL OF APPLIED PHYSICS, 2002, 91 (09) : 5840 - 5852
  • [26] Micro-Raman scattering of bismuth titanate at low temperature
    Meng, JF
    Katiyar, RS
    Zou, GT
    JOURNAL OF RAMAN SPECTROSCOPY, 1997, 28 (10) : 797 - 801
  • [27] Investigation of the Stress in MOS Structures with Micro-Raman Scattering
    Borowicz, P.
    Borowicz, L.
    Brzezinska, D.
    ACTA PHYSICA POLONICA A, 2009, 116 : S42 - S44
  • [28] Relation of Anodisation Parameter for Nanocrystallite Size of Porous Silicon Template Studied by micro-Raman Spectroscopy
    Asli, N. A.
    Rusop, M.
    Abdullah, S.
    NANOSYNTHESIS AND NANODEVICE, 2013, 667 : 324 - 328
  • [29] The Dependence of Micro-Raman Spectra on Hydrogenation in Nanocrystalline Silicon
    Lyou, Jong H.
    PHYSICS OF SEMICONDUCTORS: 30TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, 2011, 1399
  • [30] Structural investigation of silicon carbide with micro-Raman spectroscopy
    Borowicz, Pawel
    Gutt, Tomasz
    Malachowski, Tomasz
    Latek, Mariusz
    PRZEGLAD ELEKTROTECHNICZNY, 2010, 86 (11A): : 123 - 128
12345