High resolution transmission electron microscopy study of nanoscale Ni-rich NiAl films evaporated onto NaCl and KCl

被引:0
|
作者
Univ of Antwerp, Antwerp, Belgium [1 ]
机构
来源
Nanostruct Mater | / 1卷 / 99-115期
关键词
Chlorine compounds - Crystal atomic structure - Crystal microstructure - Crystal orientation - Dislocations (crystals) - Evaporation - High resolution electron microscopy - Nickel alloys - Sodium chloride - Surfaces - Textures;
D O I
暂无
中图分类号
学科分类号
摘要
The atomic and microstructure of Ni-rich B2 NixAl100-x thin films with nanoscale dimensions, for thickness as well as lateral grain size, and produced by evaporation onto NaCl and KCl(001) surfaces are investigated by high resolution electron microscopy. Different textures and orientation relationships with the substrate are found exhibiting grains with [001],[011] and [111] zones parallel with the film normal. Local distortions including precursor-like domains and surface shearing as well as dislocations are observed in the grains. No micromodulations as in bulk martensite precursors are visible. No martensitic transformation was observed when cooling the free standing films to -170°C.
引用
收藏
相关论文
共 50 条
  • [41] Microstructure of Cr (N,O) thin films studied by high resolution transmission electron microscopy
    Suzuki, Kazuma
    Suematsu, Hisayuki
    Thorogood, Gordon James
    Suzuki, Tsuneo
    THIN SOLID FILMS, 2017, 625 : 111 - 114
  • [42] High-resolution transmission and scanning electron microscopy of boride-nitride nanostructured films
    R. A. Andrievskii
    G. V. Kalinnikov
    D. V. Shtanskii
    Physics of the Solid State, 2000, 42 : 760 - 766
  • [43] Study of structures at the boundary and defects in organic thin films of perchlorocoronene by high-resolution and analytical transmission electron microscopy
    Koshino, Masanori
    Kurata, Hiroki
    Isoda, Seiij
    ULTRAMICROSCOPY, 2010, 110 (12) : 1465 - 1474
  • [44] In situ high-resolution transmission electron microscopy study of interfacial reactions of Cu thin films on amorphous silicon
    Lee, SB
    Choi, DK
    Phillipp, F
    Jeon, KS
    Kim, CK
    APPLIED PHYSICS LETTERS, 2006, 88 (08)
  • [45] Focused ion beam/scanning electron microscopy tomography and conventional transmission electron microscopy assessment of Ni4Ti3 morphology in compression-aged Ni-rich Ni-Ti single crystals
    Cao, Shanshan
    Somsen, Christoph
    Croitoru, Mihail
    Schryvers, Dominique
    Eggeler, Gunther
    SCRIPTA MATERIALIA, 2010, 62 (06) : 399 - 402
  • [46] Transmission electron microscopy and high-resolution electron microscopy of growth defects in La2-xSrxCuO4 thin films
    Alimoussa, A
    Casanove, MJ
    Hutchison, JL
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1997, 76 (05): : 907 - 919
  • [47] The atomistic structure of a Sigma=3,(111) grain boundary in NiAl, studied by quantitative high-resolution transmission electron microscopy
    Nadarzinski, K
    Ernst, F
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1996, 74 (03): : 641 - 664
  • [48] High resolution transmission electron microscopy studies of σ phase in Ni-based single crystal superalloys
    Sun, Fei
    Zhang, Jianxin
    Liu, Pan
    Feng, Qiang
    Han, Xiaodong
    Mao, Shengcheng
    JOURNAL OF ALLOYS AND COMPOUNDS, 2012, 536 : 80 - 84
  • [49] Transmission electron microscopy study of the deformation behavior of Cu/Nb and Cu/Ni nanoscale multilayers during nanoindentation
    Bhattacharyya D.
    Mara N.A.
    Dickerson P.
    Hoagland R.G.
    Misra A.
    Journal of Materials Research, 2009, 24 (3) : 1291 - 1302
  • [50] Transmission electron microscopy study of the deformation behavior of Cu/Nb and Cu/Ni nanoscale multilayers during nanoindentation
    Bhattacharyya, D.
    Mara, N. A.
    Dickerson, P.
    Hoagland, R. G.
    Misra, A.
    JOURNAL OF MATERIALS RESEARCH, 2009, 24 (03) : 1291 - 1302