High resolution transmission electron microscopy study of nanoscale Ni-rich NiAl films evaporated onto NaCl and KCl

被引:0
|
作者
Univ of Antwerp, Antwerp, Belgium [1 ]
机构
来源
Nanostruct Mater | / 1卷 / 99-115期
关键词
Chlorine compounds - Crystal atomic structure - Crystal microstructure - Crystal orientation - Dislocations (crystals) - Evaporation - High resolution electron microscopy - Nickel alloys - Sodium chloride - Surfaces - Textures;
D O I
暂无
中图分类号
学科分类号
摘要
The atomic and microstructure of Ni-rich B2 NixAl100-x thin films with nanoscale dimensions, for thickness as well as lateral grain size, and produced by evaporation onto NaCl and KCl(001) surfaces are investigated by high resolution electron microscopy. Different textures and orientation relationships with the substrate are found exhibiting grains with [001],[011] and [111] zones parallel with the film normal. Local distortions including precursor-like domains and surface shearing as well as dislocations are observed in the grains. No micromodulations as in bulk martensite precursors are visible. No martensitic transformation was observed when cooling the free standing films to -170°C.
引用
收藏
相关论文
共 50 条
  • [1] High resolution transmission electron microscopy study of nanoscale Ni-rich NiAl films evaporated onto NaCl and KCl
    Yandouzi, M
    Toth, L
    Schryvers, D
    NANOSTRUCTURED MATERIALS, 1998, 10 (01): : 99 - 115
  • [2] Transmission electron microscopy study of Ni-rich, Ag-Ni nanowires
    Srivastava, Chandan
    Rai, Rajesh Kumar
    CHEMICAL PHYSICS LETTERS, 2013, 575 : 91 - 96
  • [3] HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF POLYCRYSTALLINE EVAPORATED TITANIUM MONOXIDE FILMS
    JUN, SG
    BURSILL, LA
    YOSHIDA, K
    YAMADA, Y
    OTA, H
    ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1984, 40 (DEC): : 549 - 554
  • [4] STUDY OF EVAPORATED GOLD TIN FILMS USING TRANSMISSION ELECTRON-MICROSCOPY
    BUENE, L
    FALKENBERGARELL, H
    TAFTO, J
    THIN SOLID FILMS, 1980, 65 (02) : 247 - 257
  • [5] A high-resolution photoemission study of nanoscale aluminum oxide films on NiAl(110)
    Mulligan, A
    Dhanak, V
    Kadodwala, M
    LANGMUIR, 2005, 21 (18) : 8312 - 8318
  • [6] High resolution electron microscopy study of nanostructured Ni2Si thin films
    Bernardo, JRD
    de Almeida, LH
    Losch, W
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1999, 173 (01): : 247 - 252
  • [7] High-resolution transmission electron microscopy study of epitaxial passive films on nanocubes of chromium
    Rao, JC
    Zhang, XX
    Qin, B
    Fung, KK
    PHILOSOPHICAL MAGAZINE LETTERS, 2003, 83 (06) : 395 - 401
  • [8] Transmission electron microscopy study of Ni-Si nanocomposite films
    Mohiddon, Md Ahamad
    Krishna, M. Ghanashyam
    Dalba, G.
    Rocca, F.
    MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 2012, 177 (13): : 1108 - 1112
  • [9] High-resolution transmission electron microscopy study of discontinuously precipitated Ni3Sn
    Carvalho, PA
    Sijbolts, M
    Kooi, BJ
    De Hosson, JTM
    ACTA MATERIALIA, 2000, 48 (17) : 4203 - 4215
  • [10] Graphene oxide monolayers as supporting films for high resolution transmission electron microscopy
    Yuan, Bing
    Zhang, Zexin
    Zhou, Kun
    APPLIED SURFACE SCIENCE, 2011, 257 (13) : 5754 - 5758