Characterization of X-ray contact microscopic imaging in keV spectral region using laser produced plasmas

被引：0
|
作者：
Chakera, J.A. [1 ]
Kumbhare, S.R. [1 ]
Gupta, P.D. [1 ]
机构：
[1] Cent for Advanced Technology, Indore, India
来源：
Journal of X-Ray Science and Technology | 1998年 / 8卷 / 02期
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摘要：
X ray microscopes
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页码：135 / 143
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