High resolution X-ray diffraction study of a tubular liquid crystal

被引:0
|
作者
Univ of Pennsylvania, Philadelphia, United States [1 ]
机构
来源
Adv Mater | / 16卷 / 1363-1366期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Revisit of α-Chitin Crystal Structure Using High Resolution X-ray Diffraction Data
    Sikorski, Pawel
    Hori, Ritsuko
    Wada, Masahisa
    BIOMACROMOLECULES, 2009, 10 (05) : 1100 - 1105
  • [22] Crystal structure determination of thymoquinone by high-resolution X-ray powder diffraction
    Pagola, S
    Benavente, A
    Raschi, A
    Romano, E
    Molina, MAA
    Stephens, PW
    AAPS PHARMSCITECH, 2004, 5 (02):
  • [23] High-resolution multiple-crystal monochromator for x-ray diffraction studies
    Journal of Applied Crystallography, 1996, 29 (pt 3):
  • [24] A high-resolution multiple-crystal monochromator for X-ray diffraction studies
    Giannini, C
    Tapfer, L
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1996, 29 : 230 - 235
  • [25] DESIGN OF HIGH-RESOLUTION X-RAY OPTICAL SYSTEMS USING CRYSTAL DIFFRACTION
    KOHRA, K
    HASHIZUME, H
    IIDA, A
    ISHIDA, H
    ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 : S233 - S233
  • [26] High resolution X-ray diffraction study of the Si doping influence on columnar crystal growth of GaN layers
    Harutyunyan, VS
    Zielinska-Rohozinska, E
    Regulska, M
    JOURNAL OF ALLOYS AND COMPOUNDS, 2004, 362 (1-2) : 287 - 292
  • [27] High-resolution x-ray diffraction study of InGaAs/InP superlattices
    Francesio, L.
    Franzosi, P.
    Landgren, G.
    Journal of Physics D: Applied Physics, 1995, 28 (4A):
  • [28] X-RAY DIFFRACTION STUDY OF ARGON CRYSTAL GROWTH
    PETERSON, OG
    BATCHELD.DN
    SIMMONS, RO
    JOURNAL OF APPLIED PHYSICS, 1965, 36 (09) : 2682 - &
  • [29] Resonant x-ray diffraction study of a new brominated chiral SmCA* liquid crystal
    Cluzeau, P
    Gisse, P
    Ravaine, V
    Levelut, AM
    Barois, P
    Huang, CC
    Rieutord, F
    Nguyen, HT
    FERROELECTRICS, 2000, 244 (1-4) : 301 - 318
  • [30] High resolution x-ray diffraction and x-ray topography study of GaN on Al2O3
    Chaudhuri, J
    Ng, MH
    Koleske, DD
    Wickenden, AE
    Henry, RL
    WIDE-BANDGAP SEMICONDUCTORS FOR HIGH POWER, HIGH FREQUENCY AND HIGH TEMPERATURE, 1998, 512 : 315 - 320