Coexistence of two different energy transfer processes in SiO2 films containing Si nanocrystals and Er

被引：0
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作者：
Fujii, Minoru [1 ]
Imakita, Kenji [1 ]
Watanabe, Kei [1 ]
Hayashi, Shinji [1 ]
机构：
[1] Dept. of Elec. and Electronic Eng., Faculty of Engineering, Kobe University, Rokkodai, Nada, Kobe 657-8501, Japan
来源：
Journal of Applied Physics | 2004年 / 95卷 / 01期
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页码：272 / 280
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