Electronically induced instability of a hydrogen-carbon complex in silicon and its dissociation mechanism

被引：0
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作者：
Kamiura, Yoichi [1 ]
Hayashi, Masao [1 ]
Nishiyama, Yoshihide [1 ]
Ohyama, Shigeki [1 ]
Yamashita, Yoshifumi [1 ]
机构：
[1] Okayama Univ, Okayama, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1997年 / 36卷 / 11期
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页码：6579 / 6590
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