Analysis of variable angle spectroscopic ellipsometric measurements on uncoated magneto-optic materials

被引：0
|
作者：
McGahan, William A. [1 ]
Shan, Z.S. [1 ]
Woollam, John A. [1 ]
机构：
[1] Univ of Nebraska, United States
来源：
Applied physics communications | 1988年 / 8卷 / 04期
关键词：
Dielectric Function Tensor - Ellipsometric Measurements - Kerr Ellipticity - Kerr Rotation - Polar Kerr Effect - Variable Angle Spectroscopic Ellipsometry;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
收藏
页码：209 / 216
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