Microcrystal prism method for refractive index measurements on zeolite-based nanocomposites

被引：0
|
作者：
Inst of Applied Chemistry, Berlin, Germany [1 ]
机构：
来源：
Microporous Mater | / 1-2卷 / 43-50期
关键词：
Anisotropy - Birefringence - Light polarization - Molecular sieves - Nonlinear optics - Optical materials - Optical variables measurement - Refractive index - Second harmonic generation - Zeolites;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A new method for the measurement of the refractive index of small crystals is described. The method is based on refraction of transmitted light by prismatic crystals. The usage of the method is demonstrated on dye-loaded molecular sieve crystals, which are of interest as nonlinear optical materials. For these birefringent materials the wavelength- and polarization-dependent refractive indices are determined for the first time. These measurements allow the calculation of the phase matching conditions for the SHG process of these crystals.
引用
收藏
相关论文
共 50 条
  • [31] DETERMINING THE REFRACTIVE-INDEX AND THICKNESS OF THIN-FILMS FROM PRISM COUPLER MEASUREMENTS
    KIRSCH, ST
    APPLIED OPTICS, 1981, 20 (12): : 2085 - 2089
  • [32] Sensitivity dependence of surface plasmon resonance based sensors on prism refractive index
    Wang, Guo-Ping
    Sugiura, Tadao
    Kawata, Satoshi
    Wuhan University Journal of Natural Sciences, 2002, 7 (01) : 47 - 50
  • [33] Based on the refractive angle method of complex refractive index measurement
    Zhang, Qiuzhang
    Luo, Tianshu
    OPTIK, 2018, 174 : 692 - 697
  • [34] Sensitivity Dependence of Surface Plasmon Resonance Based Sensors on Prism Refractive Index
    Wang Guo-ping 1
    2.Department of Applied Physics
    WuhanUniversityJournalofNaturalSciences, 2002, (01) : 47 - 50
  • [35] REFRACTIVE INDICES OF HIGH INDEX LIQUIDS BY THE PRISM METHOD ON THE 2-CIRCLE GONIOMETER
    WOLFE, CW
    FRANKLIN, V
    AMERICAN MINERALOGIST, 1949, 34 (11-1) : 893 - 895
  • [36] Monitoring the Ammonia Loading of Zeolite-Based Ammonia SCR Catalysts by a Microwave Method
    Reiss, Sebastian
    Schoenauer, Daniela
    Hagen, Gunter
    Fischerauer, Gerhard
    Moos, Ralf
    CHEMICAL ENGINEERING & TECHNOLOGY, 2011, 34 (05) : 791 - 796
  • [37] Refractive index gradient measurement across the thickness of a dielectric film by the prism coupling method
    Sokolov, V. I.
    Panchenko, V. Ya
    Seminogov, V. N.
    QUANTUM ELECTRONICS, 2012, 42 (08) : 739 - 742
  • [38] Refractive index measurements of photosensitives materials using Abeles method
    Martins, J. S.
    Rene, P. S.
    Pinho, R. R.
    Lima, C. R. A.
    REVISTA BRASILEIRA DE ENSINO DE FISICA, 2013, 35 (03):
  • [39] ALTERNATIVES TO THE MINIMUM DEVIATION METHOD FOR REFRACTIVE-INDEX MEASUREMENTS
    DOUGAL, RC
    AMERICAN JOURNAL OF PHYSICS, 1986, 54 (04) : 376 - 377
  • [40] Ray Tracing Method of Gradient Refractive Index Medium Based on Refractive Index Step
    Zhang, Qingpeng
    Tan, Yi
    Ren, Ge
    Tang, Tao
    APPLIED SCIENCES-BASEL, 2021, 11 (03): : 1 - 10
12345