Infrared evanescent-field microscope using CO2 laser for reflectance measurement

被引:0
|
作者
Nakano, T. [1 ]
Kawata, S. [1 ]
机构
[1] Osaka Univ, Osaka, Japan
来源
Optik (Jena) | 1993年 / 94卷 / 04期
关键词
Diffraction - Microscopes - Reflectance measurement - Reflectometers - Spectroscopy - Spectrum analysis;
D O I
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中图分类号
学科分类号
摘要
We build the experimental set up using a CO2 laser as an infrared light source and a pyramid shaped tip made of Zinc Selenide (ZnSe) as a light probe to investigate the possibility of an infrared evanescent field microscope for infrared micro-spectroscopic application. We verified that the generated evanescent field at the top of the pyramid shaped tip changed to a propagation wave when the sample is placed at the near-field region of the probe tip. We observed a sample with a high resolution which exceeds the diffraction limit of a conventional infrared microscope. We also described other factor that affect the performance of the microscope.
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页码:159 / 162
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