Case for low voltage high resolution scanning electron microscopy of biological samples

被引：0
|
作者：
Pawley, J.B.
Erlandsen, S.L.
机构：
来源：
Proceedings of the Pfefferkorn Conference | 1988年
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] AN APPLICATION OF HIGH VOLTAGE ELECTRON MICROSCOPY TO STUDY OF BIOLOGICAL MATERIALS . HIGH VOLTAGE ELECTRON MICROSCOPY
    HAMA, K
    PORTER, KR
    JOURNAL DE MICROSCOPIE, 1969, 8 (02): : 149 - &
  • [22] High resolution scanning electron microscopy of plasmodesmata
    Brecknock, Sarah
    Dibbayawan, Teresa P.
    Vesk, Maret
    Vesk, Peter A.
    Faulkner, Christine
    Barton, Deborah A.
    Overall, Robyn L.
    PLANTA, 2011, 234 (04) : 749 - 758
  • [23] High resolution scanning electron microscopy of plasmodesmata
    Sarah Brecknock
    Teresa P. Dibbayawan
    Maret Vesk
    Peter A. Vesk
    Christine Faulkner
    Deborah A. Barton
    Robyn L. Overall
    Planta, 2011, 234 : 749 - 758
  • [24] APPLICATION OF LOW-VOLTAGE, HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY TO THE STUDY OF HIGH-PERFORMANCE POLYMERS
    VEZIE, DL
    THOMAS, EL
    HUDSON, SD
    ADAMS, WW
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 203 : 268 - POLY
  • [25] Manipulating biological samples for environmental scanning electron microscopy observation
    Tai, SSW
    Tang, XM
    SCANNING, 2001, 23 (04) : 267 - 272
  • [26] Biomaterials with low-voltage scanning electron microscopy
    LajousPetter, AM
    Schnoy, N
    Holland, G
    EUROPEAN JOURNAL OF CELL BIOLOGY, 1997, 74 : 73 - 73
  • [27] On low voltage scanning electron microscopy and chemical microanalysis
    Boyes, ED
    MICROSCOPY AND MICROANALYSIS, 2000, 6 (04) : 307 - 316
  • [28] LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY
    PAWLEY, J
    JOURNAL OF MICROSCOPY, 1984, 136 (OCT) : 45 - 68
  • [29] BIOLOGICAL APPLICATIONS OF HIGH VOLTAGE ELECTRON MICROSCOPY
    MAYO, CR
    JERNKONTORETS ANNALER, 1971, 155 (08): : 530 - &
  • [30] High-resolution low-dose scanning transmission electron microscopy
    Buban, James P.
    Ramasse, Quentin
    Gipson, Bryant
    Browning, Nigel D.
    Stahlberg, Henning
    JOURNAL OF ELECTRON MICROSCOPY, 2010, 59 (02): : 103 - 112
12345