Non-optical methods of sample-tip distance regulation based on shear force in scanning near-field optical microscope

被引：0
|
作者：
Liu, Xiumei [1 ]
Wang, Jia [1 ]
Li, Dacheng [1 ]
机构：
[1] Tsinghua Univ, Beijing, China
来源：
Kang T'ieh/Iron and Steel (Peking) | 1998年 / 33卷 / 11期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
收藏
页码：6 / 10
相关论文
共 50 条
  • [41] Shear-force distance control at megahertz frequencies for near-field scanning optical microscopy
    Simon, A
    Brunner, R
    White, JO
    Hollricher, O
    Marti, O
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (11): : 4178 - 4182
  • [42] A compact near-field scanning optical microscope
    Merritt, G
    Monson, E
    Betzig, E
    Kopelman, R
    ULTRAMICROSCOPY, 1998, 71 (1-4) : 183 - 189
  • [43] A probe for a near-field scanning optical microscope
    Inst for Physics of Microstructures, Nizhnij Novgorod, Russia
    Prib Tekh Eksp, 2 (138-139):
  • [44] Near-field scanning optical microscope using a metallized cantilever tip for nanospectroscopy
    Inouye, Y
    Hayazawa, N
    Hayashi, K
    Sekkat, Z
    Kawata, S
    NEAR-FIELD OPTICS: PHYSICS, DEVICES, AND INFORMATION PROCESSING, 1999, 3791 : 40 - 48
  • [45] A probe for a near-field scanning optical microscope
    Dryakhlushin, VF
    Klimov, AY
    Rogov, VV
    Gusev, SA
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1998, 41 (02) : 275 - 276
  • [46] Near-field scanning tunnelling optical microscope
    Papayan, GV
    Voronin, YM
    Shchetnev, YF
    Kichenko, EV
    JOURNAL OF OPTICAL TECHNOLOGY, 1997, 64 (12) : 1147 - 1150
  • [47] Simulation of near-field optical manipulator using the combination of a near-field scanning optical microscope probe and an atomic force microscope metallic probe
    Liu, Binghui
    Yang, Lijun
    Wang, Yang
    JOURNAL OF APPLIED PHYSICS, 2011, 109 (10)
  • [48] Tip-sample distance regulation for near-field scanning optical microscopy using the bending angle of the tapered fiber probe
    Wei, PK
    Fann, WS
    JOURNAL OF APPLIED PHYSICS, 1998, 84 (09) : 4655 - 4660
  • [49] A COMBINED NEAR-FIELD OPTICAL AND FORCE MICROSCOPE
    MOERS, MHP
    TACK, RG
    VANHULST, NF
    BOLGER, B
    SCANNING MICROSCOPY, 1993, 7 (03) : 789 - 792
  • [50] Development of a shear-force scanning near-field cathodoluminescence microscope for characterization of nanostructures' optical properties
    Bercu, N. B.
    Troyon, M.
    Molinari, M.
    JOURNAL OF MICROSCOPY, 2016, 263 (03) : 357 - 364
12345