MICRO-ELECTRONIC SYSTEMS RELIABILITY PREDICTION.

被引：0
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作者：
O'Connor, P.D.T.
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来源：
Quality assurance London | 1979年 / 5卷 / 04期
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
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摘要：
MATHEMATICAL MODELS - RELIABILITY
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页码：113 / 116
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