Growth, structure and electrical characteristics of epitaxial nickel silicide from chemically electroless Ni deposition on Si

被引:0
|
作者
机构
[1] Chang, Y.S.
[2] Hsieh, I.J.
[3] Lee, J.Y.
来源
Chang, Y.S. | 1600年 / 25期
关键词
Annealing Temperature - Epitaxial Silicides - Lattice Defects - Nickel Silicide;
D O I
暂无
中图分类号
学科分类号
摘要
(Edited Abstract)
引用
收藏
相关论文
共 50 条
  • [11] Epitaxial erbium silicide films on (100) silicon: growth, structure and electrical properties
    Travlos, A
    Salamouras, N
    Flouda, E
    APPLIED SURFACE SCIENCE, 1997, 120 (3-4) : 355 - 364
  • [12] Growth, structure and electrical properties of epitaxial thulium silicide thin films on silicon
    Travlos, A
    Salamouras, N
    Boukos, N
    JOURNAL OF APPLIED PHYSICS, 1997, 81 (03) : 1217 - 1221
  • [13] Dependence of electrical characteristics on interfacial structure of epitaxial NiSi2/Si schottky contacts formed from Ni/Ti/Si system
    Nakatsuka, Osamu
    Suzuki, Atsushi
    Akimoto, Shingo
    Sakai, Akira
    Ogawa, Masaki
    Zaima, Shigeaki
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (04) : 2402 - 2406
  • [14] EPITAXIAL ERBIUM SILICIDE FILMS ON SI(111) SURFACE - FABRICATION, STRUCTURE, AND ELECTRICAL-PROPERTIES
    DUBOZ, JY
    BADOZ, PA
    PERIO, A
    OBERLIN, JC
    DAVITAYA, FA
    CAMPIDELLI, Y
    CHROBOCZEK, JA
    APPLIED SURFACE SCIENCE, 1989, 38 (1-4) : 171 - 177
  • [15] Epitaxial growth and electrical characteristics of β-SiC on Si by low-pressure rapid thermal chemical vapor deposition
    Hwang, Jun-Dar
    Fang, Yean-Kuen
    Song, You-Joung
    Yaung, Dun-Nian
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1995, 34 (03): : 1447 - 1450
  • [16] XTEM studies of nickel silicide growth on Si(100) using a Ni/Ti bilayer system
    Falke, U
    Fenske, F
    Schulze, S
    Hietschold, M
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1997, 162 (02): : 615 - 621
  • [17] INFLUENCE OF NATURE OF SI SUBSTRATE ON NICKEL SILICIDE FORMED FROM THIN NI FILMS
    OLOWOLAFE, JO
    NICOLET, MA
    MAYER, JW
    THIN SOLID FILMS, 1976, 38 (02) : 143 - 150
  • [18] Electrical characterization of C-coated nickel silicide nanowires grown on Ni-loaded Si substrate
    Lee, KS
    Lee, SH
    Mo, YH
    Nahm, KS
    Kim, JJ
    Lee, CH
    KOREAN JOURNAL OF CHEMICAL ENGINEERING, 2004, 21 (06) : 1240 - 1244
  • [19] Electrical characterization of C-coated nickel silicide nanowires grown on Ni-loaded Si substrate
    Kyung Sun Lee
    Seung Hyun Lee
    Young Hwan Mo
    Kee Suk Nahm
    Ju Jin Kim
    Choong Hun Lee
    Korean Journal of Chemical Engineering, 2004, 21 : 1240 - 1244
  • [20] Investigation of Electrical Characteristics of Composites Produced by Electroless Ni Plating of Si3N4
    Yonetken, Ahmet
    GAZI UNIVERSITY JOURNAL OF SCIENCE, 2015, 28 (03): : 419 - 424