Spatial and temporal characterization of programming charge in SONOS memory cell: Effects of localized electron trapping

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[1] Kim, Bomsoo
[2] Baek, Chang-Ki
[3] Kwon, Wookhyun
[4] Lee, Jawoong
[5] Jeong, Yoon-Ha
[6] Kim, Dae M.
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Kim, B. | 1600年 / Japan Society of Applied Physics卷 / 43期
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