IDDQ testing as a component of a test suite: The need for several fault coverage metrics

被引：0
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作者：
Maxwell, Peter C. [1 ]
Aitken, Robert C. [1 ]
机构：
[1] Hewlett-Packard Co, Santa Clara, United States
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1992年 / 3卷 / 04期
关键词：
701.1 Electricity: Basic Concepts and Phenomena - 713 Electronic Circuits - 714.2 Semiconductor Devices and Integrated Circuits - 723.2 Data Processing and Image Processing - 913.3 Quality Assurance and Control - 931 Classical Physics; Quantum Theory; Relativity;
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摘要：
24
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页码：305 / 316
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