X-ray diffraction analysis for the recrystallization behavior of SiCw/Al composite at high temperature

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作者：
Jiang, Chuanhai
Wu, Jiansheng
Wang, Dezun
机构：
[1] Lab. for High Temp. Mat. and Tests, Sch. of Mat. Sci. and Eng., Shanghai Jiaotong Univ., Shanghai 200030, China
[2] Sch. of Mat. Sci. and Eng., Harbin Inst. of Technol., Harbin 150001, China
来源：
Jinshu Xuebao/Acta Metallurgica Sinica | 2004年 / 40卷 / 10期
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页码：1023 / 1026
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