USE OF PRONY'S METHOD FOR MEASURING THE THICKNESS OF LAYERED DIELECTRICS.

被引：0

作者：

Drobakhin, O.O. ^{[1
]}

Korotkaya, V.G. ^{[1
]}

机构：

[1] Dneptropetrovsk State Univ, Dneptropetrovsk, USSR, Dneptropetrovsk State Univ, Dneptropetrovsk, USSR

来源：

The Soviet journal of nondestructive testing | 1987年 / 23卷 / 05期

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D O I：

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摘要：

引用

页码：315 / 323

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