Near-field soft X-ray diffraction modelled by the multislice method

被引:0
|
作者
机构
来源
| 1600年 / 41期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Experimental investigation of soft x-ray diffraction
    Xu, XD
    Hong, YL
    Huo, TL
    Jiang, SP
    Shan, XB
    Yang, SG
    Fu, SJ
    X-RAY MICROSCOPY, PROCEEDINGS, 2000, 507 : 501 - 504
  • [22] Resonant soft X-ray diffraction - in extremis
    Hatton, PD
    Wilkins, SB
    Beale, TAW
    Johal, TK
    Prabhakaran, D
    Boothroyd, AT
    JOURNAL OF SYNCHROTRON RADIATION, 2005, 12 : 434 - 441
  • [23] Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure-property characterization
    Li, Qian
    Marks, Samuel D.
    Bean, Sunil
    Fisher, Michael
    Walko, Donald A.
    DiChiara, Anthony D.
    Chen, Xinzhong
    Imura, Keiichiro
    Sato, Noriaki K.
    Liu, Mengkun
    Evans, Paul G.
    Wen, Haidan
    JOURNAL OF SYNCHROTRON RADIATION, 2019, 26 : 1790 - 1796
  • [24] Near-field x-ray phase contrast imaging and phase retrieval algorithm
    Zhu, HF
    Xie, HL
    Gao, HY
    Chen, JW
    Li, RX
    Xu, ZZ
    CHINESE PHYSICS, 2005, 14 (04): : 796 - 801
  • [25] X-ray microtomography using correlation of near-field speckles for material characterization
    Zanette, Irene
    Zdora, Marie-Christine
    Zhou, Tunhe
    Burvall, Anna
    Larsson, Daniel H.
    Thibault, Pierre
    Hertz, Hans M.
    Pfeiffer, Franz
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2015, 112 (41) : 12569 - 12573
  • [26] Micro Scale Distribution of Nanoparticles Studied with X-ray Near-Field Scattering
    Shinohara, Yuya
    Yoshii, Teruaki
    Kishimoto, Hiroyuki
    Uesugi, Kentaro
    Amemiya, Yoshiyuki
    KOBUNSHI RONBUNSHU, 2014, 71 (11) : 580 - 585
  • [27] Near diffraction limited coherent diffractive imaging with tabletop soft x-ray sources
    Sandberg, Richard L.
    Raymondson, Daisy A.
    Schlotter, William F.
    Raines, Kevin
    La-O-Vorakiat, Chan
    Paul, Ariel
    Murnane, Margaret M.
    Kapteyn, Henry C.
    Miao, Jianwei
    9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2009, 186
  • [28] THE POPULATION OF TWIN RELATED BOUNDARIES IN HIGH PURITY NICKEL AS MEASURED WITH NEAR-FIELD HIGH ENERGY X-RAY DIFFRACTION MICROSCOPY
    Hefferan, C. M.
    Li, S. F.
    Lind, J.
    Pokharel, R.
    Lienert, U.
    Rollett, A. D.
    Suter, R. M.
    8TH INTERNATIONAL SYMPOSIUM ON SUPERALLOY 718 AND DERIVATIVES, 2014, : 885 - 896
  • [29] GaN films studied by near-field scanning optical microscopy, atomic force microscopy and high resolution X-ray diffraction
    Liu, JT
    Zhi, D
    Redwing, JM
    Tischler, MA
    Kuech, TF
    JOURNAL OF CRYSTAL GROWTH, 1997, 170 (1-4) : 357 - 361
  • [30] Estimation of coherence properties of an undulator-generated x-ray beam from near-field and far-field slit diffraction visibilities
    Jacques, V. L. R.
    Le Bolloc'h, D.
    Pinsolle, E.
    Picca, F. -E.
    Ravy, S.
    PHYSICAL REVIEW B, 2012, 86 (14):