SELF-TEST N-STREAM ONLINE ISOLATION.

被引：0
|
作者：
Anon
机构：
来源：
IBM technical disclosure bulletin | 1986年 / 29卷 / 05期
关键词：
AUTOMATIC TESTING;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Utilizing an n-stream simulation program, which can have performance as much as n times as fast as a conventional simulator provides a practical process for identifying the first failing self-test pattern even in the presence of large circuit counts, large pattern counts, and arrays in the hardware under test. It is the speed of the n-stream simulator which makes the processor practical for large logical entities.
引用
收藏
页码：2004 / 2008
相关论文
共 50 条
  • [21] SELF-TEST PROGRAMMING FOR AUTOMATIC TEST EQUIPMENT
    AUGUSTOWSKI, J
    IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1976, 12 (02) : 307 - 308
  • [22] SELF-TEST - THE SOLUTION TO THE VLSI TEST PROBLEM
    TOTTON, K
    SHAW, S
    IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES, 1988, 135 (04): : 190 - 195
  • [23] Online Built-In Self-Test Architecture for Automated Testing of a Solar Tracking Equipment
    Jurj, Sorin Liviu
    Rotar, Raul
    Opritoiu, Flavius
    Vladutiu, Mircea
    2020 20TH IEEE INTERNATIONAL CONFERENCE ON ENVIRONMENT AND ELECTRICAL ENGINEERING AND 2020 4TH IEEE INDUSTRIAL AND COMMERCIAL POWER SYSTEMS EUROPE (EEEIC/I&CPS EUROPE), 2020,
  • [24] On Built-In Self-Test for Adders
    Pulukuri, Mary D.
    Stroud, Charles E.
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2009, 25 (06): : 343 - 346
  • [25] Self-test Monte Carlo method
    Ohta, S
    NUCLEAR PHYSICS B, 1996, : 788 - 791
  • [26] Circular self-test path for FSMs
    Politecnico di Torino, Torino, Italy
    IEEE Des Test Comput, 4 (50-60):
  • [27] Circular self-test path for FSMs
    Corno, F
    Prinetto, P
    Reorda, MS
    IEEE DESIGN & TEST OF COMPUTERS, 1996, 13 (04): : 50 - 60
  • [28] Calibration and Self-Test of RF Transceivers
    Zou, Yaning
    Unker, Christian M.
    Stuhlberger, Rainer
    Valkama, Mikko
    53RD IEEE INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, 2010, : 473 - 476
  • [29] Comprehensive Self-Test Plan for ATS
    Wang Changjin
    Wang Fengqin
    Cong Linhu
    PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON TEST AUTOMATION & INSTRUMENTATION, VOLS 1 - 4, 2010, : 278 - 282
  • [30] Self-test Monte Carlo method
    Ohta, S
    PROGRESS OF THEORETICAL PHYSICS SUPPLEMENT, 1996, (122): : 193 - 200
12345