Photothermal ionization spectroscopy for shallow impurities in ultra-pure silicon

被引：0

作者：

机构：

[1] Shen, S.C.

[2] Yu, Z.Y.

[3] Huang, Y.X.

来源：

Shen, S.C. | 1600年 / 11期

关键词：

Semiconducting Silicon;

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摘要：

引用

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