Using embedded automatic test equipment for SOC design

被引：0

|

作者：

Agarwal, Vinod

机构：

来源：

Computer Design | 1998年 / 37卷 / 10期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

收藏

相关论文

共 50 条

[41] Design and test equipment
Electronic Product Design, 1992, 13 (01):
[42] Design and test equipment
Electron Prod Des, 7 (48):
[43] Design and test equipment
Electronic Product Design, 1994, 15 (06):
[44] Design & test equipment
Electronic Product Design, 1998, 19 (11):
[45] Design and test equipment
Electronic Product Design, 1997, 18 (02):
[46] Design and test equipment
Electron Prod Des, 6 (97):
[47] Design and test equipment
Electronic Product Design, 1996, 17 (10):
[48] Design and test equipment
Electronic Product Design, 1997, 18 (06):
[49] Design and test equipment
Electron Prod Des, 2 (59):
[50] Design and test equipment
Electron Prod Des, 3 (103):

← 1 2 3 4 5 →