Cross-sectional scanning tunneling microscopy

被引：0
|
作者：
机构：
来源：
Chem Rev | / 4卷 / 1017期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] Alloy ordering in GaInP alloys: A cross-sectional scanning tunneling microscopy study
    Liu, N
    Shih, CK
    Geisz, J
    Mascarenhas, A
    Olson, JM
    APPLIED PHYSICS LETTERS, 1998, 73 (14) : 1979 - 1981
  • [22] Local electronic structures of GaMnAs observed by cross-sectional scanning tunneling microscopy
    Tsuruoka, T
    Tachikawa, N
    Ushioda, S
    Matsukura, F
    Takamura, K
    Ohno, H
    APPLIED PHYSICS LETTERS, 2002, 81 (15) : 2800 - 2802
  • [23] Cross-sectional scanning tunneling microscopy of GaAsSb/GaAs quantum well structures
    Zuo, SL
    Hong, YG
    Yu, ET
    Klem, JF
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (07) : 3761 - 3770
  • [24] Cross-sectional scanning-tunneling microscopy of stacked InAs quantum dots
    Eisele, H
    Flebbe, O
    Kalka, T
    Preinesberger, C
    Heinrichsdorff, F
    Krost, A
    Bimberg, D
    Dähne-Prietsch, M
    APPLIED PHYSICS LETTERS, 1999, 75 (01) : 106 - 108
  • [25] CROSS-SECTIONAL IMAGING AND SPECTROSCOPY OF GAAS DOPING SUPERLATTICES BY SCANNING TUNNELING MICROSCOPY
    FEENSTRA, RM
    YU, ET
    WOODALL, JM
    KIRCHNER, PD
    LIN, CL
    PETTIT, GD
    APPLIED PHYSICS LETTERS, 1992, 61 (07) : 795 - 797
  • [26] Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy
    Cobley, R. J.
    Teng, K. S.
    Brown, M. R.
    Rees, P.
    Wilks, S. P.
    APPLIED SURFACE SCIENCE, 2010, 256 (19) : 5736 - 5739
  • [27] Ellipsoidal InAs quantum dots observed by cross-sectional scanning tunneling microscopy
    Blokland, J. H.
    Bozkurt, M.
    Ulloa, J. M.
    Reuter, D.
    Wieck, A. D.
    Koenraad, P. M.
    Christianen, P. C. M.
    Maan, J. C.
    APPLIED PHYSICS LETTERS, 2009, 94 (02)
  • [28] Perspectives of cross-sectional scanning tunneling microscopy and spectroscopy for complex oxide physics
    Wang, Aaron
    Chien, TeYu
    PHYSICS LETTERS A, 2018, 382 (11) : 739 - 748
  • [29] DIRECT IMAGING OF DOPANTS IN GAAS WITH CROSS-SECTIONAL SCANNING-TUNNELING-MICROSCOPY
    JOHNSON, MB
    ALBREKTSEN, O
    FEENSTRA, RM
    SALEMINK, HWM
    APPLIED PHYSICS LETTERS, 1993, 63 (21) : 2923 - 2925
  • [30] Shape control of quantum dots studied by cross-sectional scanning tunneling microscopy
    Keizer, J. G.
    Bozkurt, M.
    Bocquel, J.
    Mano, T.
    Noda, T.
    Sakoda, K.
    Clark, E. C.
    Bichler, M.
    Abstreiter, G.
    Finley, J. J.
    Lu, W.
    Rohel, T.
    Folliot, H.
    Bertru, N.
    Koenraad, P. M.
    JOURNAL OF APPLIED PHYSICS, 2011, 109 (10)
12345