Stokes polarimetry for x rays using multiple-beam diffraction

被引：0
|
作者：
机构：
来源：
Rev Sci Instrum | / 2 pt 2卷 / 1610期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] Multiple-beam X-ray diffraction for physical determination of reflection phases and its applications
    Weckert, E.
    Hummer, K.
    Acta Crystallographica, Section A: Foundations of Crystallography, 1997, 53 (pt 2):
  • [22] Multiple-beam X-ray diffraction for physical determination of reflection phases and its applications
    Weckert, E
    Hummer, K
    ACTA CRYSTALLOGRAPHICA SECTION A, 1997, 53 : 108 - 143
  • [23] A NOVEL SMALL-ANGLE SCATTERING CAMERA DESIGN USING MULTIPLE-BEAM DIFFRACTION
    PAHL, R
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 347 (1-3): : 491 - 494
  • [24] MULTIPLE DIFFRACTION OF X-RAYS
    COLELLA, R
    ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1982, 37 (05): : 437 - 447
  • [25] Continuous X-ray multiple-beam diffraction with primary Bragg angle from 0 to 90°
    Huang, Xian-Rong
    Jia, Quanjie
    Wieczorek, Michael
    Assoufid, Lahsen
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2014, 47 : 1716 - 1721
  • [26] DETERMINATION OF PHASE USING MULTIPLE-BEAM EFFECTS
    TISCHLER, JZ
    BATTERMAN, BW
    ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 : 510 - 514
  • [27] MULTIPLE-BEAM KLYSTRON
    不详
    CURRENT SCIENCE, 1962, 31 (09): : 365 - &
  • [28] MULTIPLE-BEAM INTERFEROMETRY
    TOLANSKY, S
    ENDEAVOUR, 1950, 9 (36) : 196 - 202
  • [29] MULTIPLE-BEAM SPECTROSCOPY
    ROSTLER, PS
    COOPER, WS
    KUNKEL, WB
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1972, 17 (11): : 986 - 986
  • [30] MULTIPLE-BEAM INTERFEROMETRY
    MOLEN, GM
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1978, 27 (03) : 246 - 249
12345