Low-temperature dephasing in disordered conductors: experimental aspects

被引：0
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作者：
Gershenson, M.E. [1 ]
机构：
[1] Serin Physics Laboratory, Rutgers University, Piscataway, NJ 08854-8019, United States
来源：
Annalen der Physik (Leipzig) | 1999年 / 8卷 / 07期
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(Edited Abstract)
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页码：559 / 568
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