共 50 条
- [41] IN-SITU X-RAY DIFFRACTION IMAGING OF POLYCRYSTALLINE MATERIALS ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 63 - 63
- [42] Thickness of polycrystalline copper coating measured by X-ray diffraction APPLIED CRYSTALLOGRAPHY XXI, 2010, 163 : 9 - 12
- [43] Glancing incidence x-ray diffraction of polycrystalline thin films Thin-Film Compound Semiconductor Photovoltaics, 2005, 865 : 75 - 86
- [46] X-Ray Diffraction Study of Micro Amounts of Polycrystalline Samples Journal of Structural Chemistry, 2010, 51 : 744 - 757
- [47] AN X-RAY DIFFRACTION STUDY OF POLYCRYSTALLINE BRASS DEFORMED IN TENSION TRANSACTIONS OF THE METALLURGICAL SOCIETY OF AIME, 1967, 239 (07): : 1092 - +
- [48] Wide angle X-ray diffraction topography of polycrystalline materials NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS IX, 1999, 497 : 655 - 660