Building-in reliability during library development: hot-carrier degradation is no longer a problem of the technologists only!

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作者：
Bellens, R. [1 ]
Clemminck, I. [1 ]
Van Doorselaer, K. [1 ]
机构：
[1] Alcatel Telecom, Antwerp, Belgium
来源：
Microelectronics Reliability | 1997年 / 37卷 / 10-11期
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页码：1425 / 1428
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