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- [22] HOPPING CONDUCTION IN PHOSPHORUS-DOPED SILICON. Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties, 1985, 52 (03): : 427 - 435
- [23] THE ELECTRONIC STOPPING AND RANGE PROFILE CALCULATIONS FOR HIGH-ENERGY IMPLANTATION OF PHOSPHORUS INTO SILICON NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 21 (01): : 8 - 13
- [24] ANALYTICAL DESCRIPTION OF HIGH-ENERGY IMPLANTATION PROFILES OF BORON AND PHOSPHORUS INTO CRYSTALLINE SILICON RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1994, 127 (3-4): : 385 - 395
- [26] Study of the annealing kinetic effect and implantation energy on phosphorus-implanted silicon wafers using spectroscopic ellipsometry Journal of Applied Physics, 2006, 99 (12):
- [27] PULSED ELECTRON BEAM ANNEALING APPARATUS AND ANNEALING OF As-IMPLANTED SILICON. Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1981, 2 (03): : 234 - 239
- [28] STUDY OF THIN SiO2 FILMS SYNTHESISED BY HIGH DOSE AND LOW ENERGY OXYGEN ION IMPLANTATION INTO SILICON. Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1985, 6 (06): : 584 - 589
- [29] INFLUENCE OF ANNEALING ON THE STRUCTURAL AND ELECTRONIC PROPERTIES OF SHAPED SILICON. Bulletin of the Academy of Sciences of the U.S.S.R. Physical series, 1982, 47 (02): : 139 - 143
- [30] CW Ar + -LASER ANNEALING CHARACTERISTICS OF HIGH-DOSE As + - AND Sb + -IMPLANTED SILICON. Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1985, 6 (06): : 641 - 647