Redundancy Improves Yield of Semiconductor Memories.

被引：0
|
作者：
Heinrich, Peter
机构：
来源：
Elektronik Munchen | 1981年 / 30卷 / 20期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
DATA STORAGE, SEMICONDUCTOR
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页码：79 / 86
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