Relationship between surface roughness of indium tin oxide and leakage current of organic light-emitting diode

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作者：
Kim, Ki-Beom [1 ]
Tak, Yoon-Heung [2 ]
Han, Yoon-Soo [2 ]
Baik, Kwang-Heum [2 ]
Yoon, Myung-Hee [2 ]
Lee, Moon-Ho [1 ]
机构：
[1] Department of Applied Electronics, Yeungnam University, 214-1 Daedong, Kyungsan 712-749, Korea, Republic of
[2] OLED Division, LG Ellie, LG Electronics, 191-1 Kongdandong, Kumi 730-030, Korea, Republic of
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| 1600年 / Japan Society of Applied Physics卷 / 42期
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