Polarized reflectance spectroscopy and spectroscopic ellipsometry determination of the optical anisotropy of gallium nitride on sapphire

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作者：
Yu, Guolin [1 ]
Ishikawa, Hiroyasu [1 ]
Egawa, Takashi [1 ]
Soga, Tetsuo [1 ]
Watanabe, Junji [1 ]
Jimbo, Takashi [1 ]
Umeno, Masayoshi [1 ]
机构：
[1] Nagoya Inst of Technology, Nagoya, Japan
来源：
Japanese Journal of Applied Physics, Part 2: Letters | 1997年 / 36卷 / 8 A期
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