Micro-Raman study of ultra-thin YBa2Cu3O7-δ/YSZ films

被引:0
|
作者
Chen, M.S. [1 ]
Shen, Z.X. [1 ]
Zhou, W.Z. [1 ]
Xu, S.Y. [1 ]
Ong, C.K. [1 ]
机构
[1] Department of Physics, Natl. Univ. Singapore, 10 Kent R., Singapore, Singapore
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:117 / 123
相关论文
共 50 条
  • [31] Spontaneous magnetic moments in YBa2Cu3O7-δ thin films
    Tafuri, F
    Kirtley, JR
    PHYSICAL REVIEW B, 2000, 62 (21): : 13934 - 13937
  • [32] Ionic liquid gating of ultra-thin YBa2Cu3O7-x films
    Fete, A.
    Rossi, L.
    Augieri, A.
    Senatore, C.
    APPLIED PHYSICS LETTERS, 2016, 109 (19)
  • [33] Ferroelectric field effect in YBa2Cu3O7-δ thin films
    Aidam, R
    Fuchs, D
    Schneider, R
    PHYSICA C, 1999, 328 (1-2): : 21 - 30
  • [34] Oxygen dynamics in epitaxial YBa2Cu3O7-δ thin films
    R. Platzer
    I.D. Dumkow
    J.A. Gardner
    J. Tate
    Hyperfine Interactions, 1999, 120-121 : 325 - 329
  • [35] The analysis of interior misorientations in thin films of YBa2Cu3O7-δ
    Svechnikov, VL
    METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2001, 23 (12): : 1613 - 1619
  • [36] Magnetization of YBa2Cu3O7-δ thin films at low fields
    Krylov, IP
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2002, 15 (07): : 1105 - 1112
  • [37] Fabrication and characterisation of underdoped YBa2Cu3O7-δ thin films
    Farnan, GA
    McCurry, MP
    Walmsley, DG
    PHYSICA C, 2000, 341 : 2335 - 2336
  • [38] Tunneling and thin films in YBa2Cu3O7-δ oxide superconductor
    Carotenuto, M.
    Cucolo, A.M.
    Di Leo, R.
    Nigro, A.
    Nobile, G.
    Pace, S.
    Romano, P.
    Savo, B.
    Vaglio, R.
    Vuoto Bologna, 1988, 18 (03): : 245 - 247
  • [39] Quantum size effects in ultra-thin YBa2Cu3O7-x films
    Lyatti, M.
    Gundareva, I.
    Roeper, T.
    Popovic, Z.
    Jalil, A. R.
    Gruetzmacher, D.
    Schaepers, T.
    SCIENTIFIC REPORTS, 2024, 14 (01):
  • [40] Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7−x thin films
    O. Martínez
    J. Jiménez
    D. Chambonnet
    C. Belouet
    Journal of Materials Research, 2000, 15 : 1069 - 1075