EVOLUTION OF SMT METALLIZED FILM CAPACITORS.

被引：0
|
作者：
Fabbri, C. [1 ]
Bernadi, A. [1 ]
机构：
[1] Arcotronics Italia SpA, Arcotronics Italia SpA
来源：
JEE. Journal of electronic engineering | 1987年 / 24卷 / 252期
关键词：
INTEGRATED CIRCUITS - Electronics Packaging - PLASTICS - SOLDERING;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
After the first experimental phase, surface mount technology (SMT) plstic film chip capacitors have been introduced in the production environment of many companies. The hardest obstacle to overcome has been the soldering process. The dielectric now available is metallized polyester (MKT). Other dielectrics are under evaluation, mainly for the higher working temeprature allowed. PPS is the most promising materials.
引用
收藏
页码：32 / 37
相关论文
共 50 条
  • [41] Randomization Method Application in Numerical Investigation of Metallized Film Capacitors
    Ivanov, Ivan
    Fedotov, Nikita
    Hojamov, Ahmet
    2021 IEEE 62ND INTERNATIONAL SCIENTIFIC CONFERENCE ON POWER AND ELECTRICAL ENGINEERING OF RIGA TECHNICAL UNIVERSITY (RTUCON), 2021,
  • [42] Lifetime Prediction of Metallized Film Capacitors Based on Capacitance Loss
    Li, Zhiwei
    Li, Hua
    Lin, Fuchang
    Chen, Yaohong
    Liu, De
    Wang, Bowen
    Zhang, Qin
    He, Wei
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2013, 41 (05) : 1313 - 1318
  • [43] Eliminating infant mortality in metallized film capacitors by defect detection
    McCluskey, F. P.
    Li, N. M.
    Mengotti, E.
    MICROELECTRONICS RELIABILITY, 2014, 54 (9-10) : 1818 - 1822
  • [44] THERMAL RATING OF METALLIZED FILM CAPACITORS UNDER PULSE CONDITIONS
    GEEN, JA
    RADIO AND ELECTRONIC ENGINEER, 1974, 44 (04): : 218 - 226
  • [45] Efficiency Evaluation of Electrodes Segmentation Patterns for Metallized Film Capacitors
    Ivanov, Ivan
    Glivenko, Dmitry
    Feklistov, Efrem
    Belko, Victor
    Kulbako, Kirin
    2020 IEEE 61ST ANNUAL INTERNATIONAL SCIENTIFIC CONFERENCE ON POWER AND ELECTRICAL ENGINEERING OF RIGA TECHNICAL UNIVERSITY (RTUCON), 2020,
  • [46] Electric 3D-simulation of metallized film capacitors
    Ostrowski, Joerg
    Hiptmair, Ralf
    Fuhrmann, Henning
    COMPEL-THE INTERNATIONAL JOURNAL FOR COMPUTATION AND MATHEMATICS IN ELECTRICAL AND ELECTRONIC ENGINEERING, 2007, 26 (02) : 524 - 543
  • [47] Lifetime Improvement of Metallized Film Capacitors by Inner Pressure Strengthening
    Li, Zhiwei
    Li, Hua
    Lin, Fuchang
    Liu, De
    Wang, Bowen
    Dai, Ling
    Li, Haoyuan
    Zhang, Qin
    Chen, Yaohong
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2013, 41 (10) : 3063 - 3068
  • [48] Lifetime improvement of metallized film capacitors by inner pressure strengthening
    State Key Lab. of Advanced Electromagnetic Eng. and Tech. , Wuhan 430074, China
    不详
    Li, H. (leehua@mail.hust.edu.cn), 1600, Editorial Office of High Power Laser and Particle Beams (26):
  • [49] Reliability assessment of the metallized film capacitors from degradation data
    Zhao, Jianyin
    Liu, Fang
    MICROELECTRONICS RELIABILITY, 2007, 47 (2-3) : 434 - 436
  • [50] Metallized Film Capacitors Degradation under High Electrodynamic Load
    Belko, Victor O.
    Emelyanov, Oleg A.
    Ivanov, Ivan O.
    Glivenko, Dmitry Y.
    PROCEEDINGS OF THE 2017 IEEE RUSSIA SECTION YOUNG RESEARCHERS IN ELECTRICAL AND ELECTRONIC ENGINEERING CONFERENCE (2017 ELCONRUS), 2017, : 1120 - 1122
12345