INVESTIGATION OF THE LATTICE TILTS AT GROWTH SECTOR BOUNDARIES USING DOUBLE-CRYSTAL X-RAY DIFFRACTOMETRY.

被引：0
|
作者：
Parpia, D.Y. [1 ]
Barnett, S.J. [1 ]
Hill, M.J. [1 ]
机构：
[1] Univ of Durham, Durham, Engl, Univ of Durham, Durham, Engl
来源：
| 1600年 / 53期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
QUARTZ
引用
收藏
相关论文
共 50 条
  • [21] DOUBLE-CRYSTAL X-RAY SPECTROSCOPY AT JET
    BARNSLEY, R
    SCHUMACHER, U
    KALLNE, E
    MORSI, HW
    RUPPRECHT, G
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (04): : 889 - 898
  • [22] INVESTIGATION OF GAAS/SI MATERIAL BY X-RAY DOUBLE-CRYSTAL DIFFRACTION
    LI, CR
    MAI, ZH
    CUI, SF
    ZHOU, JM
    WANG, YT
    JOURNAL OF APPLIED PHYSICS, 1991, 70 (08) : 4172 - 4175
  • [23] A DOUBLE-CRYSTAL SOFT X-RAY SPECTROMETER
    SUONINEN, E
    KARRAS, M
    LEVOSKA, J
    ACTA POLYTECHNICA SCANDINAVICA-PHYSICS INCLUDING NUCLEONICS SERIES, 1970, (71): : 1 - &
  • [24] Ultra-high-angle double-crystal X-ray diffractometry (U-HADOX) for determining a change in the lattice spacing: experiment
    Munakata, K
    Okazaki, A
    ACTA CRYSTALLOGRAPHICA SECTION A, 2004, 60 : 33 - 39
  • [25] Ultra-high-angle double-crystal X-ray diffractometry (U-HADOX) for determining a change in the lattice spacing: theory
    Okazaki, A
    Soejima, Y
    ACTA CRYSTALLOGRAPHICA SECTION A, 2001, 57 : 708 - 712
  • [26] Direct measurement of InGaAs/GaAs lattice relaxation by double-crystal X-ray diffraction
    Zhuang, Yan
    Wang, Yutian
    Ma, Wengquan
    Lin, Yaowang
    Zhou, Zengqi
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1997, 18 (07): : 508 - 512
  • [27] ON THE FOCUSING CONDITIONS FOR DOUBLE-CRYSTAL X-RAY SPECTROMETERS
    SPENCER, RC
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1952, 23 (03): : 138 - 139
  • [28] The resolution function of a double-crystal X-ray diffractometer
    E. M. Pashaev
    I. A. Subbotin
    M. A. Chuev
    V. V. Kvardakov
    A. E. Golovanov
    I. A. Likhachev
    Instruments and Experimental Techniques, 2009, 52 : 712 - 720
  • [29] Design of a double-crystal x-ray vacuum spectrometer
    Parratt, LG
    PHYSICAL REVIEW, 1932, 41 (05): : 553 - 560
  • [30] HIGH-ANGLE DOUBLE-CRYSTAL X-RAY-DIFFRACTOMETRY (HADOX) - COMBINATION WITH A SEALED-TUBE X-RAY SOURCE
    IRIE, K
    KOSHIJI, N
    OKAZAKI, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (08): : 1504 - 1506
12345