Review of X-ray powder diffraction data of rhombohedral bismuth tri-iodide

被引：1
|
作者：
Keller, L. [1 ]
Nason, D. [2 ]
机构：
[1] CAMET Research, Incorporated, Goleta, CA 93117, United States
[2] EG and G Ener. Measurements, Inc., Santa Barbara Operations, Goleta, CA 93117, United States
来源：
Powder Diffraction | 1996年 / 11卷 / 02期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：91 / 96
相关论文
共 50 条
  • [41] On pattern matching of X-ray powder diffraction data
    Ivanisevic, I
    Bugay, DE
    Bates, S
    JOURNAL OF PHYSICAL CHEMISTRY B, 2005, 109 (16): : 7781 - 7787
  • [42] X-ray powder diffraction data for indium nitride
    Paszkowicz, W
    POWDER DIFFRACTION, 1999, 14 (04) : 258 - 260
  • [43] X-ray powder diffraction data for rhornbohedral AlPt
    Rodriguez, Mark A.
    Adams, David P.
    POWDER DIFFRACTION, 2006, 21 (04) : 318 - 319
  • [44] A KWIC INDEX TO X-RAY DIFFRACTION POWDER DATA
    MATTHEWS, FW
    THOMSON, L
    ANALYTICAL CHEMISTRY, 1966, 38 (04) : 666 - &
  • [45] X-ray powder diffraction data for the mineral refikite
    Pazout, R.
    Sejkora, J.
    POWDER DIFFRACTION, 2012, 27 (03) : 215 - 216
  • [46] X-ray powder diffraction data for compound DyNiSn
    Nong, Liangqin
    Zeng, Lingmin
    Hao, Jianmin
    Powder Diffraction, 1997, 12 (03): : 134 - 135
  • [47] X-ray powder diffraction data and characterization of Mirabegron
    Quintana Mendoza, Jose H.
    Henao, J.A.
    Aparicio, Andrea P.
    Romero Bohorquez, Arnold R.
    Powder Diffraction, 2017, 32 (04): : 290 - 294
  • [48] Fabrication and testing of antimony doped bismuth tri-iodide semiconductor gamma-ray detectors
    Gokhale, Sasmit S.
    Han, HyukSu
    Pelaez, Oswaldo
    Baciak, James E.
    Nino, Juan C.
    Jordan, Kelly A.
    RADIATION MEASUREMENTS, 2016, 91 : 1 - 8
  • [49] CURRENT APPLICATIONS OF X-RAY POWDER DIFFRACTION - A REVIEW
    Das, Rasel
    Ali, Md. Eaqub
    Abd Hamid, Sharifah Bee
    REVIEWS ON ADVANCED MATERIALS SCIENCE, 2014, 38 (02) : 95 - 109
  • [50] X-ray powder diffraction
    Fuess, H
    ANALES DE QUIMICA-INTERNATIONAL EDITION, 1998, 94 (06): : 388 - 395
12345