共 50 条
- [41] Characterization of traps in crystalline silicon on glass film using deep-level transient spectroscopy GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY XIV, 2011, 178-179 : 100 - +
- [44] AMORPHOUS ZNO THIN-FILM NONLINEAR RESISTOR JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (09): : L1493 - L1494