Variation of the stress dependent magnetic flux leakage signal with defect depth and flux density

被引：0
|
作者：
Krause, Thomas W. [1 ]
Donaldson, R.M. [1 ]
Barnes, R. [1 ]
Atherton, David L. [1 ]
机构：
[1] Queen's Univ, Kingston, Canada
来源：
NDT and E International | 1996年 / 29卷 / 02期
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页码：79 / 86
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