Comparative investigations of bolometric properties of thin-film structures based on vanadium dioxide and amorphous hydrated silicon

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Malyarov, V.G.
Khrebtov, I.A.
Kulikov, Yu. V.
Shaganov, I.I.
Zerov, V. Yu.
Feoktistov, N.A.
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页码:136 / 142
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