共 50 条
- [21] COMBINED DIRECT METHODS WITH ISOMORPHOUS REPLACEMENT AND ANOMALOUS SCATTERING TECHNIQUES. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 250 - 250
- [25] MINORITY CARRIER DIFFUSION LENGTH MEASUREMENTS: A REVIEW AND COMPARISON OF TECHNIQUES. Applied physics communications, 1982, 2 (1-2): : 17 - 56
- [28] Light scattering by periodic roughness at dielectric surface SCATTERING AND SURFACE ROUGHNESS III, 2000, 4100 : 199 - 210
- [29] Characterizing interfacial roughness by light scattering ellipsometry CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY 2000, INTERNATIONAL CONFERENCE, 2001, 550 : 186 - 190
- [30] INNOGRAPH TECHNIQUES. 1600, Budapest University of Technology and Economics, Budafoki ut 4, Budapest, H-1111, Hungary (30): : 3 - 4