共 50 条
- [34] Structure of Internal Getter in Silicon Obtained by Czochralski Method. Elektronika Warszawa, 1987, 28 (09): : 9 - 13
- [35] IMPURITY CLOUDS AND MICRODEFECTS IN SILICON GROWN BY THE CZOCHRALSKI METHOD. Soviet physics. Semiconductors, 1983, 17 (12): : 1366 - 1369
- [37] ANALYSIS OF THE CONDITIONS OF SMALL-ANGLE BOUNDARY APPEARANCE IN THE PROCESS OF SILICON SINGLE-CRYSTALS GROWING BY THE CZOCHRALSKI METHOD KRISTALLOGRAFIYA, 1979, 24 (06): : 1259 - 1265
- [39] DISLOCATION-FREE SILVER SINGLE-CRYSTALS GROWN BY CZOCHRALSKI METHOD ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1973, A 28 (05): : 676 - &