Thin polysilylene films. Their electronic and photoelectrical properties

被引：0
|
作者：
Nespurek, S.
机构：
来源：
Materials Science and Engineering C | 1999年 / 8-9卷
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：319 / 327
相关论文
共 50 条
  • [21] Photoelectrical Properties and Energetical Structure of Thin Films of Indandione Derivatives
    Indrikova, Maira
    Latvels, Janis
    Muzikante, Inta
    Turovska, Baiba
    MATERIALS SCIENCE-MEDZIAGOTYRA, 2011, 17 (02): : 125 - 131
  • [22] PHOTOELECTRICAL PROPERTIES OF CUINSE2 THIN-FILMS
    TRYKOZKO, R
    BACEWICZ, R
    FILIPOWICZ, J
    SOLAR CELLS, 1986, 16 (1-4): : 351 - 356
  • [23] Electrical and photoelectrical properties of vacuum deposited SnSe thin films
    Padiyan, DP
    Marikani, A
    Murali, KR
    CRYSTAL RESEARCH AND TECHNOLOGY, 2000, 35 (08) : 949 - 957
  • [24] Chemical Composition and Electronic Transport Properties of Na2KSb, Cs Thin Films.
    Doliz, Pierre
    Acta electronica Paris, 1987, 27 (3-4): : 181 - 190
  • [25] Optical and electronic properties of electron polymerized thiophene films.
    Ahn, H
    Whitten, JE
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 222 : U288 - U288
  • [26] EFFECT OF THICKNESS ON THE ELECTRICAL PROPERTIES OF AlSb THIN FILMS.
    Patel, S.M.
    Biradar, A.M.
    Indian Journal of Pure and Applied Physics, 1983, 21 (07): : 418 - 419
  • [27] Substrate influence on the ferroelectric properties of PTCa thin films.
    Jimenez, R
    Poyato, R
    Pardo, L
    Alemany, C
    Mendiola, J
    BOLETIN DE LA SOCIEDAD ESPANOLA DE CERAMICA Y VIDRIO, 1999, 38 (05): : 482 - 486
  • [28] EFFECT OF ANNEALING ON ELECTRICAL PROPERTIES OF THIN CdSe FILMS.
    Jakubowski, A.
    Electron Technology (Warsaw), 1975, 8 (3-4): : 59 - 66
  • [29] MULTICOMPONENT THIN FILMS.
    Kuznetsov, A.Ya.
    Kuleshov, A.P.
    Sakharova, K.V.
    1978, 45 (07): : 447 - 449
  • [30] INVESTIGATION INTO THE STRUCTURE AND ELECTRICAL PROPERTIES OF THIN MOLYBDENUM FILMS.
    Protsenko, I.E.
    Yaremenko, A.V.
    Physics of Metals (English Translation of Metallofizika), 1983, 4 (02): : 326 - 332
12345