METHOD FOR THE CORRECTION OF INTENSITY OF THE BACKGROUND IN ELECTRON PROBE MICROANALYSIS.

被引：0

作者：

Oda, Yuzo

Konaka, Minoru

机构：

来源：

Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan | 1981年 / 67卷 / 01期

关键词：

D O I：

10.2355/tetsutohagane1955.67.1_153

中图分类号：

学科分类号：

摘要：

By this method measurements of chemical composition can be done by the additive intensities of continuous X-rays irradiated from each element in the sample.

引用

页码：153 / 158

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