METHOD FOR THE CORRECTION OF INTENSITY OF THE BACKGROUND IN ELECTRON PROBE MICROANALYSIS.

被引：0
|
作者：
Oda, Yuzo
Konaka, Minoru
机构：
来源：
Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan | 1981年 / 67卷 / 01期
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D O I：
10.2355/tetsutohagane1955.67.1_153
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学科分类号：
摘要：
By this method measurements of chemical composition can be done by the additive intensities of continuous X-rays irradiated from each element in the sample.
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页码：153 / 158
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